The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Mar. 11, 2022
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Shingo Yamanouchi, Tokyo, JP;

Shinichi Morimoto, Tokyo, JP;

Kazumine Ogura, Tokyo, JP;

Tatsuya Sumiya, Tokyo, JP;

Masaru Eto, Tokyo, JP;

Toshiyuki Nomura, Tokyo, JP;

Masayuki Ariyoshi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/04 (2020.01); G06F 21/31 (2013.01); G01N 23/10 (2018.01);
U.S. Cl.
CPC ...
G01S 17/04 (2020.01); G01N 23/10 (2013.01); G06F 21/31 (2013.01);
Abstract

To shorten a waiting time for a belongings inspection, the present invention provides an inspection systemincluding an acquisition unitthat acquires personal unique information unique to each of inspection target persons, and a determination unitthat determines a content of a belongings inspection based on a signal of a reflection wave of an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter for the each inspection target person, based on the personal unique information.


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