The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Feb. 18, 2022
Applicant:

President and Fellows of Harvard College, Cambridge, MA (US);

Inventors:

Michael S. Grinolds, Cambridge, MA (US);

Sungkun Hong, Cambridge, MA (US);

Patrick Maletinsky, Cambridge, MA (US);

Amir Yacoby, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/14 (2010.01); G01N 24/10 (2006.01); G01R 33/032 (2006.01); G01Q 60/54 (2010.01); G01R 33/12 (2006.01); G01R 33/60 (2006.01); G01R 33/022 (2006.01); G01N 21/64 (2006.01); G01Q 60/38 (2010.01); G01Q 30/02 (2010.01); G01Q 60/08 (2010.01); G01R 33/32 (2006.01);
U.S. Cl.
CPC ...
G01Q 70/14 (2013.01); G01N 21/645 (2013.01); G01N 24/10 (2013.01); G01Q 60/38 (2013.01); G01Q 60/54 (2013.01); G01R 33/022 (2013.01); G01R 33/032 (2013.01); G01R 33/1284 (2013.01); G01R 33/60 (2013.01); G01N 2201/10 (2013.01); G01Q 30/025 (2013.01); G01Q 60/08 (2013.01); G01R 33/323 (2013.01);
Abstract

A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.


Find Patent Forward Citations

Loading…