The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2023
Filed:
Dec. 20, 2018
Shimadzu Corporation, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A defect inspection apparatus () is provided with and an excitation unit () for exciting elastic waves, an irradiation unit () for emitting laser light, a measurement unit () for measuring interference light, and a control unit (). The control unit is configured to acquire an image () representing a vibration state of an inspection target object () in a measurement area based on a measurement result of the measurement unit (), detect a discontinuous portion in a vibration state in the measurement area from the image representing the vibration state as a defect (), and identify a type of the defect based on at least one of a shape () of the detected defect and the vibration state of a defective portion.