The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Oct. 30, 2019
Applicant:

Kyocera Corporation, Kyoto, JP;

Inventor:

Hiroyasu Tanaka, Kyoto, JP;

Assignee:

KYOCERA Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/02 (2006.01); G01N 29/22 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01N 29/022 (2013.01); G01N 29/222 (2013.01); G01N 29/24 (2013.01); G01N 2291/01 (2013.01); G01N 2291/022 (2013.01); G01N 2291/0255 (2013.01); G01N 2291/0256 (2013.01); G01N 2291/0423 (2013.01); G01N 2291/105 (2013.01);
Abstract

A measurement device includes a sensor that detects a particular substance, a storage unit that stores calibration data that indicate a relationship between a measurement value of the particular substance and an output of the sensor, and a calculation unit that calculates the measurement value of the particular substance from the calibration data based on the output of the sensor. The calculation unit produces a first waveform where a plurality of first outputs of the sensor are normalized, produces a plurality of second waveforms where a plurality of second outputs of the sensor that are included in the calibration data are normalized. The calculation unit calculates a measurement value of the particular substance based on the first waveform and the plurality of second waveforms.


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