The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Feb. 28, 2018
Applicant:

The University of Tokyo, Tokyo, JP;

Inventors:

Makoto Fujita, Tokyo, JP;

Daishi Fujita, Tokyo, JP;

Yuya Domoto, Tokyo, JP;

Hiroki Takezawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2018.01); G01N 23/205 (2018.01); G01N 23/2055 (2018.01); G01N 23/207 (2018.01); G01N 23/20008 (2018.01); C30B 7/04 (2006.01); C40B 30/10 (2006.01); C40B 50/08 (2006.01); C40B 40/16 (2006.01); G01N 23/20091 (2018.01);
U.S. Cl.
CPC ...
G01N 23/2055 (2013.01); C30B 7/04 (2013.01); C40B 30/10 (2013.01); C40B 40/16 (2013.01); C40B 50/08 (2013.01); G01N 23/20 (2013.01); G01N 23/205 (2013.01); G01N 23/207 (2013.01); G01N 23/20008 (2013.01); G01N 23/2073 (2013.01); G01N 23/20091 (2013.01); G01N 2223/056 (2013.01); G01N 2223/106 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/602 (2013.01);
Abstract

The present invention provides a novel method for identifying a molecular structure by a single crystal X-ray analysis. A single crystal that gives an X-ray diffraction spectrum sufficient for determining a structure of a molecule can be efficiently obtained by including a test molecule in a metal complex, and then crystallizing the test-molecule included in the metal complex. By analyzing this single crystal by an X-ray analysis, it is possible to determine a structure of the test molecule without obtaining a single crystal of the test molecule. With the novel method according to the present invention, the structure of a test molecule in a trace amount of a sample can also be determined.


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