The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Mar. 09, 2022
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Naoya Nakayama, Tokyo, JP;

Masanori Sekido, Tokyo, JP;

Shinichi Morimoto, Tokyo, JP;

Masayuki Ariyoshi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01); G01R 27/32 (2006.01); G01N 22/00 (2006.01); G01R 27/28 (2006.01); G01R 27/06 (2006.01); G01N 22/04 (2006.01); G01N 21/3581 (2014.01);
U.S. Cl.
CPC ...
G01N 22/00 (2013.01); G01R 27/04 (2013.01); G01R 27/06 (2013.01); G01R 27/28 (2013.01); G01N 21/3581 (2013.01); G01N 22/04 (2013.01); G01N 2223/639 (2013.01);
Abstract

To shorten a waiting time for a belongings inspection, the present invention provides an inspection systemincluding: an electromagnetic wave transmission/reception unitthat irradiates an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter, and receives a reflection wave; a detection unitthat performs detection processing, based on a signal of the reflection wave; a decision unitthat decides a path in which an inspection target person advances, based on a result of the detection processing; and a guide unitthat performs processing of guiding the inspection target person to a decided path.


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