The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2023
Filed:
Feb. 13, 2022
Prime Planet Energy & Solutions, Inc., Tokyo, JP;
Toyota Jidosha Kabushiki Kaisha, Aichi-ken, JP;
Yuki Sato, Toyota, JP;
Syoichi Tsuchiya, Toyota, JP;
Masataka Asai, Toyota, JP;
Tsuyoshi Asano, Toyota, JP;
Masahiro Uchimura, Toyota, JP;
Nozomi Tateyama, Okazaki, JP;
PRIME PLANET ENERGY & SOLUTIONS, INC., Tokyo, JP;
TOYOTA JIDOSHA KABUSHIKI KAISHA, Aichi-Ken, JP;
Abstract
A nano projection structure inspection apparatus herein disclosed includes an inspection light irradiation part and a chromameter. The inspection light irradiation part irradiates inspection light to an inspected surface being a surface of a metal. An imaging optical axis of an imaging element of the chromameter is arranged to be tilted to a regular reflection direction of the inspection light caused by the inspected surface. The chromameter makes the imaging element receive diffusion reflection light, among reflection light of the inspection light from the inspected surface, the reflection light containing regular reflection light and the diffusion reflection light, so as to inspect a nanoscale projection structure on the inspected surface.