The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Aug. 25, 2021
Applicant:

Purdue Research Foundation, West Lafayette, IN (US);

Inventor:

Meng Cui, West Lafayette, IN (US);

Assignee:

PURDUE RESEARCH FOUNDATION, West Lafayette, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G06T 11/20 (2006.01); G06T 11/00 (2006.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G01N 21/6408 (2013.01); G06T 11/001 (2013.01); G06T 11/206 (2013.01); H04N 23/56 (2023.01); G01N 2201/06113 (2013.01); G01N 2201/1053 (2013.01);
Abstract

Systems and methods for analyzing samples, such as tissue samples, and measuring the emissions when these samples are exposed to light are disclosed. Embodiments include illuminating multiple target locations on a sample with laser light, which may first be manipulated by a scanner, and receiving decaying emissions from the target location. At least some embodiments include the emissions traveling backwards along a substantial portion of the laser light pathway and being received by a detector. Additional embodiments include converting the received emissions into streak lines of position versus time, converting the streak lines to plots of signal strength versus time, and curve fitting the plots to determine representative decay times. In some embodiments, the decay times are presented as plots of position on the surface of the sample versus emission strength, which may be color coded. Some embodiment dwell on each target location for multiple scans of the laser.


Find Patent Forward Citations

Quick Actions:

Cui, Meng. (2023). Line scanning mechanical streak systems and methods for phosphorescence lifetime imaging (U.S. Patent No. 11815456). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11815456

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