The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Mar. 21, 2022
Applicant:

Caipu Technology (Zhejiang) Co., Ltd., Zhejiang, CN;

Inventors:

Kun Yuan, Zhejiang, CN;

Shuanghu Gong, Zhejiang, CN;

Jian Wang, Zhejiang, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0251 (2013.01); G01J 3/0208 (2013.01); G01J 3/0232 (2013.01); G01J 3/0237 (2013.01); G01J 3/0294 (2013.01);
Abstract

Disclosed are a dual-optical-path spectrophotometer and a color measurement method thereof. The spectrophotometer includes an integrating sphere, a light source, and a sensor. A second shutter, a semi-reflecting and semi-transmitting device and lenses are arranged between the detection hole and the sensor, and a light guide device and a first shutter are arranged between a light guide hole formed in the integrating sphere and the semi-reflecting and semi-transmitting device. The color measurement method includes the following steps. A first shutter is closed, a second shutter is opened, light, reflected by the measuring opening, enters a sensor and the sensor measures a spectral reflected signal of the object surface. The first shutter is opened, the second shutter is closed, reflected light enters the sensor, and the sensor measures a spectral reflected signal of a light source. A final sampled signal is calculated.


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