The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

May. 28, 2019
Applicant:

National University Corporation Ehime University, Ehime, JP;

Inventor:

Teruhito Kido, Ehime, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5217 (2013.01); A61B 6/032 (2013.01); G06T 11/008 (2013.01); A61B 6/481 (2013.01); A61B 6/486 (2013.01); A61B 6/503 (2013.01); A61B 6/507 (2013.01); G06T 2210/41 (2013.01); G06T 2211/412 (2013.01);
Abstract

An object of the present invention is to provide an analysis method capable of analyzing time-series images by a method simpler than ever. A computer program that is an application example of the present invention is a computer program for an image processing device including a storage unit that stores therein image data including time-series computed tomography (CT) images in a plurality of frames, of an organ of a subject captured after a contrast medium has been administered causes the image processing device to execute: a first step of determining a change-over-time of a CT value on the basis of image data including CT images in the plurality of frames; a second step of determining a predetermined slope that is a slope of the CT value with respect to a predetermined time on the basis of a change-over-time of the CT value determined in the first step; and a third step of approximating a change-over-time of the CT value with a predetermined function on the basis of the predetermined slope determined in the second step.


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