The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Sep. 16, 2022
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Yasufumi Fukuma, Wako, JP;

Takefumi Hayashi, Wako, JP;

Yoko Tatara, Kita-ku, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/15 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0025 (2013.01); A61B 3/152 (2013.01);
Abstract

An ophthalmic apparatus of an exemplary aspect performs the first and second OCT scans on a subject's eye. The first OCT scan is performed on the first region including the first site of the subject's eye, and the second OCT scan is performed on the second region including the second site. The ophthalmic apparatus acquires the first deviation information of the subject's eye prior to the first OCT scan and performs alignment, and also acquires the second deviation information of the subject's eye prior to the second OCT scan and performs alignment. The ophthalmic apparatus calculates the distance between the first site and the second site based on the first data acquired through the first OCT scan and second data acquired through the second OCT scan.


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