The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Jun. 17, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Sarath Kumar Pujari, Hyderabad, IN;

Ansah Ahmed Sheik, Hyderabad, IN;

Hitesh Jain, Udaipur, IN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 8/24 (2009.01); H04W 72/0453 (2023.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04W 8/24 (2013.01); H04W 72/0453 (2013.01);
Abstract

The aspects described herein are directed to an apparatus supporting a combination of frequency bands including a first frequency band associated with a primary cell (PCell) and at least a second frequency band associated with a secondary cell (SCell). The apparatus may prune out measurements of frequency bands associated with the SCell, where the frequency bands associated with the SCell may not be supported or deployed at the apparatus when the PCell is too weak. The apparatus measures the first frequency band associated with the PCell and measures the second frequency band associated with the SCell if the measurement of the first frequency band is greater than or equal to a threshold. The apparatus transmits a report including at least the measurement of the first frequency band.


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