The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Jul. 21, 2021
Applicant:

Nuctech Company Limited, Beijing, CN;

Inventors:

Bicheng Liu, Beijing, CN;

Hao Yu, Beijing, CN;

Weizhen Wang, Beijing, CN;

Guangming Xu, Beijing, CN;

Haojie Chi, Beijing, CN;

Shangmin Sun, Beijing, CN;

Chunguang Zong, Beijing, CN;

Yu Hu, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/409 (2006.01); G06T 7/00 (2017.01); G06T 3/40 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/4092 (2013.01); G06T 3/4007 (2013.01); G06T 5/006 (2013.01); G06T 5/50 (2013.01); G06T 7/97 (2017.01); H04N 1/00005 (2013.01); H04N 1/00037 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/20021 (2013.01);
Abstract

The present disclosure provides a method and device for correcting a scanned image, and an image scanning system, and relates to the field of image scanning. The method includes obtaining a scanned image of a scanned object, detecting one or more reference objects from the scanned image, determining a deformation parameter of each reference object of the one or more reference objects based on preset a standard parameter of the each reference object, and correcting the scanned image based on the deformation parameters of the one or more reference objects.


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