The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2023
Filed:
Dec. 16, 2021
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Koichiro Manabe, Chiba, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/32 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/3263 (2013.01); H04N 1/00018 (2013.01); H04N 1/00037 (2013.01); H04N 1/00639 (2013.01); H04N 1/32667 (2013.01);
Abstract
An inspection apparatus is provided, which is operable to inspect a cut sheet that is supplied to a post-processing apparatus that post-processes sheets in units of hooks and on which an image has been formed by an image forming apparatus. The inspection apparatus inspects an image formed on a sheet for each sheet; manages results of sheet inspection by the inspection unit for respective books including a plurality of sheets; and notifies, the post-processing apparatus of a result of inspecting a book including the sheet that is based on the managed sheet inspection results.