The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Aug. 21, 2020
Applicant:

Nokia Solutions and Networks Oy, Espoo, FI;

Inventors:

Hyunseok Chang, Holmdel, NJ (US);

Muralidharan Kodialam, Marlboro, NJ (US);

T. V. Lakshman, Morganville, NJ (US);

Sarit Mukherjee, Morganville, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); H04L 9/40 (2022.01); G06F 11/34 (2006.01); G06F 18/214 (2023.01); G06N 3/044 (2023.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); G06F 11/3409 (2013.01); G06F 18/214 (2023.01); G06N 3/044 (2023.01); H04L 63/0227 (2013.01); H04L 63/1441 (2013.01);
Abstract

System, method, and software for detecting anomalies in data generated by microservices. In one embodiment, an anomaly detector collects performance metrics for a microservice deployed in a data center for an application. The anomaly detector transforms the performance metrics into a time-series structured dataset for the microservice, and feeds the structured dataset to a machine learning system to determine whether an anomaly exists in the structured dataset based on an anomaly detection model. The anomaly detector performs an anomaly classification with the machine learning system based on an anomaly classification model and the structured dataset when an anomaly is detected in the structured dataset, and performs an action based on the anomaly classification.


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