The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2023
Filed:
Mar. 04, 2021
Samsung Electronics Co., Ltd., Suwon-si, KR;
Russell Douglas Ford, San Jose, CA (US);
Mandar N. Kulkarni, Richardson, TX (US);
Pranav Madadi, Mountain View, CA (US);
Vikram Chandrasekhar, Mountain View, CA (US);
Yan Xin, Princeton, NJ (US);
Sangkyu Park, Seoul, KR;
Hakyung Jung, Seoul, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Apparatuses and methods for identifying network anomalies. A method includes determining a cumulative anomaly score over a predefined time range based on a subset of historical PM samples and determining an anomaly ratio of a first time window and a second time window, based on the cumulative anomaly score. The method also includes determining one or more anomaly events coinciding with CM parameter changes based on the anomaly ratio; collating the PM, alarm, and CM data into a combined data set based on matching fields and timestamps; generating a set of rules linking one or more CM parameter changes and the collated data to anomaly events; and generating root cause explanations for CM parameter changes that are linked to anomaly events.