The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Apr. 18, 2022
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Peter Aberl, Kranzberg, DE;

Sandeep Rao, Bangalore, IN;

Anil Mani, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/26 (2006.01); H04B 1/40 (2015.01); H04B 1/71 (2011.01);
U.S. Cl.
CPC ...
H04L 27/265 (2013.01); H04B 1/40 (2013.01); H04B 1/7102 (2013.01);
Abstract

A method is provided. In some examples, the method includes performing, by processing circuitry, a first transform operation on a first time-domain data set to generate a frequency-domain data set. In addition, the method includes determining, by the processing circuitry, that at least one portion of the frequency-domain data set satisfies a first threshold magnitude. The method also includes performing, by the processing circuitry, an inverse transform operation on the at least one portion of the frequency-domain data set to generate a second time-domain data set. The method further includes identifying, by the processing circuitry and based on the second time-domain data set, a region of interference in the first time-domain data set.


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