The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2023
Filed:
Jul. 19, 2022
Ciena Corporation, Hanover, MD (US);
Yinqing Pei, Kanata, CA;
Andrew D. Shiner, Ottawa, CA;
Alex W. MacKay, Ottawa, CA;
David W. Boertjes, Nepean, CA;
Fangyuan Zhang, Kanata, CA;
Ciena Corporation, Hanover, MD (US);
Abstract
System and methods of measuring nonlinear interference (NLI) on a per-span basis in an optical system with a plurality of spans are provided. The method includes steps of varying power based on phase sensitive detection method on a span under test of the plurality of spans; observing total noise, at an optical receiver, from all of the plurality of spans; and isolating noise for the span under test from the total noise based on the varying power. The optical system can be in-service with one or more traffic-carrying channels, and the varying power is small enough on the span under test which does not impact the one or more traffic-carrying channels.