The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2023
Filed:
Nov. 15, 2021
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Biplob Debnath, Princeton, NJ (US);
Srimat Chakradhar, Manalapan, NJ (US);
Giuseppe Coviello, Princeton, NJ (US);
Yi Yang, Princeton, NJ (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/16 (2022.01); G06V 10/75 (2022.01); G06F 18/10 (2023.01); G06F 18/2321 (2023.01);
U.S. Cl.
CPC ...
G06V 40/172 (2022.01); G06F 18/10 (2023.01); G06F 18/2321 (2023.01); G06V 10/751 (2022.01);
Abstract
Methods and systems for face clustering include determining a quality score for each of a set of input images. A first subset of the input images is clustered, having respective quality scores that exceed a predetermined threshold, to form an initial set of clusters. A second subset of the input images is clustered, having respective quality scores below the predetermined threshold. An action is performed responsive to the clustered images after the second subset is added to the initial set of clusters.