The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Jan. 31, 2020
Applicant:

Serendip Research, Osaka, JP;

Inventors:

Satoshi Kawata, Osaka, JP;

Shogo Kawano, Osaka, JP;

Assignee:

SERENDIP RESEARCH, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/62 (2017.01); G06T 7/66 (2017.01); G01N 21/65 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/75 (2017.01); G01N 21/65 (2013.01); G02B 21/006 (2013.01); G02B 21/0036 (2013.01); G06T 7/62 (2017.01); G06T 7/66 (2017.01);
Abstract

A method for obtaining image data of a subject, including; a first scanning step including a plurality of steps W, each step W being a step of determining one place existing in a one-dimensional, two-dimensional, or three-dimensional first space; and a second scanning step of scanning insides of second spaces including at least one of the places, wherein the second scanning step includes a step X of randomly determining a location of an observation point and a step Y of obtaining a piece of image data for the observation point, and, at a time point of end of scanning an inside of one of the second spaces, the second space has a first region including 50% of observation points and a second region existing outside the first region and including remaining 50% of the observation points, the second region being larger than the first region by at least 15%.


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