The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2023
Filed:
Apr. 06, 2022
Applicant:
Snap Inc., Santa Monica, CA (US);
Inventors:
Patrick Fox-Roberts, Witham, GB;
Richard McCormack, Princes Risborough, GB;
Qi Pan, London, GB;
Edward James Rosten, London, GB;
Assignee:
Snap Inc., Santa Monica, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); G06T 3/00 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); G06T 3/0093 (2013.01); G06T 5/006 (2013.01); G06T 2207/20216 (2013.01);
Abstract
The pose of a wide-angle image is determined by dewarping regions of the wide-angle image, determining estimated poses of the dewarped regions of the wide-angle image and deriving a pose of the wide-angle image from the estimated poses of the of the dewarped regions. The estimated poses of the dewarped regions may be determined by comparing features in the dewarped regions with features in prior dewarped regions from one or more prior wide-angle images, as well as by comparing features in the dewarped regions with features in a point cloud.