The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Apr. 21, 2021
Applicant:

Daegu Gyeongbuk Institute of Science and Technology, Daegu, KR;

Inventors:

Sang Hyun Park, Daegu, KR;

Philip Chikontwe, Daegu, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/593 (2017.01); G06N 20/00 (2019.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G06T 7/593 (2017.01); G06N 20/00 (2019.01); G06T 2207/10081 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30061 (2013.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01);
Abstract

A multiple instance learning device for analyzing 3D images, comprises a memory in which a multiple instance learning model is stored and at least one processor electrically connected to the memory, wherein the multiple instance learning model comprises a convolution block configured to derive a feature map for each of 2D instances of a 3D image inputted to the multiple instance learning model, a spatial attention block configured to derive spatial attention maps of the instances from the feature maps derived from the convolution block, an instance attention block configured to receive a result of combining the feature maps and the spatial attention maps and derive an attention score for each instance, and derive an aggregated embedding for the 3D image by aggregating embeddings of the instances according to the attention scores.


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