The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2023
Filed:
Mar. 26, 2021
Applicant:
Sintokogio, Ltd., Nagoya, JP;
Inventors:
Kazuhiro Ota, Toyokawa, JP;
Takeshi Sonohara, Toyokawa, JP;
Assignee:
SINTOKOGIO, LTD., Aichi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 3/14 (2006.01); G06T 11/00 (2006.01); G06T 7/73 (2017.01); G06T 3/40 (2006.01); G09G 5/38 (2006.01); G06T 7/62 (2017.01); G06V 10/98 (2022.01); G06V 10/24 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06F 3/14 (2013.01); G06T 3/40 (2013.01); G06T 7/62 (2017.01); G06T 7/73 (2017.01); G06T 11/001 (2013.01); G06V 10/245 (2022.01); G06V 10/987 (2022.01); G09G 5/38 (2013.01); G06T 2207/30116 (2013.01); G06T 2207/30204 (2013.01); G09G 2354/00 (2013.01);
Abstract
Provided is the technique that allows an operator or the like to easily grasp a defect contained in a mold. A display control device is configured to carry out: a determination process in which a feature amount of each of defects contained in a mold is determined with reference to an image obtained by image capture of a mold; and a display process in which the image is displayed on a display such that each of the defects in the image is emphasized by a method which is determined according to the determined feature amount.