The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Dec. 18, 2018
Applicant:

Federal Home Loan Mortgage Corporation (Freddie Mac), McLean, VA (US);

Inventors:

Yuang Tang, Baltimore, MD (US);

Fabio Quijada, Reston, VA (US);

Dylan Nielson, Washington, DC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2023.01); G06F 16/9032 (2019.01); G06F 17/18 (2006.01); G06N 20/00 (2019.01); G06F 18/231 (2023.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01); G06F 16/9032 (2019.01); G06F 17/18 (2013.01); G06F 18/231 (2023.01); G06N 20/00 (2019.01);
Abstract

This disclosure relates to knowledge generation and implementation. A knowledge graph system comprises at least one processor, at least one database communicatively connected to the at least one processor, and a memory storing executable instructions. When executed, the instructions cause the at least one processor to aggregate data associated with a plurality of entities, the aggregated data reflecting one or more relationships between two or more of the plurality of entities. Attribute data identifying loan amounts, property values, and appraisal sources may be extracted from the aggregated data. A knowledge graph data structure may be generated having a plurality of subject notes corresponding to the extracted attribute information. Statistical distributions of attributes associated with one or more appraisal sources may be generated and an anomaly in a first statistical distribution may be detected based on a comparison of the first statistical distribution with a second statistical distribution.


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