The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Apr. 28, 2021
Applicant:

Jpmorgan Chase Bank, N.a., New York, NY (US);

Inventors:

Bryan P Halter, Merrimack, NH (US);

Sandhya Sridharan, Los Altos, CA (US);

Sujeily Rodriguez, Wesley Chapel, FL (US);

Edward Kerbler, Tampa, FL (US);

Assignee:

JPMORGAN CHASE BANK, N.A., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/77 (2018.01); G06Q 30/018 (2023.01); G06F 16/25 (2019.01); G06F 3/14 (2006.01); G06Q 10/0639 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 8/77 (2013.01); G06F 3/14 (2013.01); G06F 16/258 (2019.01); G06Q 10/06395 (2013.01); G06Q 30/018 (2013.01); G06N 20/00 (2019.01);
Abstract

A method for providing an evidence service to facilitate evidence analytic and controls assessment for an enterprise toolchain is disclosed. The method includes compiling raw data via an adapter, the raw data including an event that relates to a software development life cycle; retrieving, from the adapter, the compiled raw data; identifying, by using a model, information that relates to the event from the raw data; extracting the identified information; generating, by using the model, a structured data set based on the extracted information; and determining a controls measurement based on the structured data set.


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