The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2023
Filed:
Mar. 29, 2021
Applicant:
Amazon Technologies, Inc., Seattle, WA (US);
Inventors:
Assignee:
AMAZON TECHNOLOGIES, INC., Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/214 (2023.01); G06T 7/73 (2017.01); G06T 11/00 (2006.01); G06F 16/9538 (2019.01); G06F 16/2457 (2019.01); G06F 16/56 (2019.01); G06F 16/54 (2019.01); G06N 3/08 (2023.01); G06F 16/9535 (2019.01); G06V 10/75 (2022.01); G06F 18/213 (2023.01); G06F 18/2113 (2023.01); G06Q 30/0601 (2023.01);
U.S. Cl.
CPC ...
G06F 18/214 (2023.01); G06F 16/24578 (2019.01); G06F 16/54 (2019.01); G06F 16/56 (2019.01); G06F 16/9535 (2019.01); G06F 16/9538 (2019.01); G06F 18/213 (2023.01); G06F 18/2113 (2023.01); G06N 3/08 (2013.01); G06T 7/74 (2017.01); G06T 11/00 (2013.01); G06V 10/751 (2022.01); G06Q 30/0603 (2013.01); G06T 2200/24 (2013.01); G06T 2207/20084 (2013.01);
Abstract
Devices and techniques are generally described for determining localized visual similarity. In some examples, a selection of a first location of interest on a first image data depicting at least one article of clothing may be received. In some examples, a first machine learning model may generate a feature map representing the first image data. In some examples, a reduced feature map may be generated based at least in part on a mapping of the first location of interest to the feature map. In some examples, a second image depicting at least a second article of clothing may be determined based at least in part on the reduced feature map.