The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Apr. 19, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Hayato Itsumi, Tokyo, JP;

Masaharu Morimoto, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/30 (2006.01); G06F 11/32 (2006.01); G06V 40/20 (2022.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G06F 11/3051 (2013.01); G06F 11/324 (2013.01); G06F 11/3428 (2013.01); G06V 40/20 (2022.01);
Abstract

Provided is a data analysis device comprising: an analysis subject acquisition part for acquiring data to be analyzed (analysis subject data); a precision estimation part for estimating the analysis precision of the analysis subject data; a selection part for selecting an analysis module to be used in analyzing the analysis subject data on the basis of the result of estimating the analysis precision of the analysis subject data and information indicating the analysis time of the analysis subject data; and an analysis execution part for analyzing the analysis subject data using the analysis module having been selected by the selection part. According to this configuration, in cases where a data analysis device configures a data analysis processing method, the operator of the data analysis device does not have to preset a determination standard for configuring the processing method.


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