The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Jul. 22, 2019
Applicant:

Semes Co., Ltd, Cheonan-si, KR;

Inventors:

Tae Woong Seo, Cheonan-si, KR;

Taerim Lee, Cheonan-si, KR;

Youngje Um, Busan, KR;

Assignee:

SEMES CO., LTD., Chungcheongnam-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/4065 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4065 (2013.01); H01L 21/67173 (2013.01); H01L 21/67259 (2013.01); G05B 2219/40006 (2013.01);
Abstract

A substrate treating apparatus includes a process module including a plurality of process units that perform a plurality of steps included in a substrate treating process and that perform the substrate treating process on substrates sequentially placed in the process units based on process recipes for the substrates, a scheduler that controls operations of the process module and the process units included in the process module, a storage that stores transfer paths information of the substrates, and a selection module that selects a process unit to proceed, by a result of feeding back the transfer paths information stored in the storage to the scheduler. The substrate treating apparatus may further include a measuring instrument that measures defect values of the transfer paths information along which the substrates are transferred. The storage may store the defect values measured by the measuring instrument according to the transfer paths information of the substrates.


Find Patent Forward Citations

Seo, Tae. (2023). Apparatus and method for treating substrate based on defect values of transfer paths (U.S. Patent No. 11809158). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11809158

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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