The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Oct. 27, 2022
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Carl A. Dins, Tempe, AZ (US);

Markus Hans Gnerlich, Plymouth, MN (US);

Patrick Duffy, Charlotte, NC (US);

Andrew Stewart, Chanhassen, MN (US);

Assignee:

Honeywell International Inc., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 21/00 (2006.01); G01P 1/00 (2006.01); G06N 3/044 (2023.01); G01P 15/08 (2006.01); G01P 15/14 (2013.01);
U.S. Cl.
CPC ...
G01P 21/00 (2013.01); G01P 1/006 (2013.01); G01P 15/08 (2013.01); G01P 15/14 (2013.01); G06N 3/044 (2023.01);
Abstract

A method for inertial sensor error modeling and compensation comprises obtaining multiple bias drift datasets for an elapsed time period for one or more gyroscopes; generating a 3D bias drift data plot using the multiple bias drift datasets; generating a partial bias drift data image based on the 3D bias drift data plot; and inputting the partial bias drift data image into a machine learning algorithm to predict how bias drift evolves over time for the gyroscopes. The machine learning algorithm uses the partial bias drift data image, the elapsed time period, and temperature history to compute a predicted bias over temperature with respect to time, to thereby predict bias drift data for a future time period for the gyroscopes. The machine learning algorithm outputs a completed bias drift image that represents drift data from the elapsed time period and the predicted bias drift data for the future time period.


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