The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2023
Filed:
Jun. 11, 2019
Applicant:
Edan Instruments, Inc., Guangdong, CN;
Inventors:
Assignee:
EDAN INSTRUMENTS, INC., Shenzhen, CN;
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/566 (2006.01); G01N 33/536 (2006.01); G01N 33/487 (2006.01); G01N 33/532 (2006.01);
U.S. Cl.
CPC ...
G01N 33/566 (2013.01); G01N 33/48707 (2013.01); G01N 33/48785 (2013.01); G01N 33/532 (2013.01); G01N 33/536 (2013.01);
Abstract
Provided are a method and device for detecting an excessive antigen concentration, and a storage medium. The method includes: subjecting a sample containing antigens to an immune reaction, obtaining a photovoltage value of the sample after subjected to the immune reaction; and determining whether an antigen concentration of the sample is excessive according to the photovoltage value of the sample.