The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2023
Filed:
Oct. 28, 2020
S.d. Sight Diagnostics Ltd., Tel Aviv, IL;
Joseph Joel Pollak, Neve Daniel, IL;
Sarah Levy Schreier, Jaffa, IL;
Yochay Shlomo Eshel, Sde Warburg, IL;
Amir Zait, Binyamina, IL;
Sharon Pecker, Rehovot, IL;
Trevor Ruggiero, Somerville, MA (US);
S.D. Sight Diagnostics Ltd., Tel Aviv, IL;
Abstract
Apparatus and methods are described including placing a sample into a sample carrier that comprises a plurality of regions having upper and lower surfaces, having respective heights that are different from each other, and being configured such that cells form a monolayer, the monolayer within respective regions of the sample carrier having respective, different densities from each other, due to the respective regions of the sample carrier having respective heights that are different from each other. Microscopic images are acquired of each of the plurality of regions. Measurements are performed upon cell types that have a relatively high density upon microscopic images of a region of the sample chamber having a relatively low height, and measurements are performed upon cell types that have a relatively low density upon microscopic images of a region of the sample chamber having a relatively great height. Other applications are also described.