The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Feb. 25, 2021
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Andrea Brambilla, Veurey-Voroize, FR;

Alexia Gorecki, Grenoble, FR;

Alexandra Potop, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 15/02 (2006.01); G01N 23/02 (2006.01); G01N 23/087 (2018.01);
U.S. Cl.
CPC ...
G01B 15/02 (2013.01); G01N 23/02 (2013.01); G01N 23/087 (2013.01); G01N 2223/03 (2013.01); G01N 2223/302 (2013.01); G01N 2223/304 (2013.01); G01N 2223/401 (2013.01); G01N 2223/423 (2013.01); G01N 2223/50 (2013.01);
Abstract

A method is provided for characterizing a sample, by estimating a plurality of characteristic thicknesses, each being associated with a calibration material. The method includes acquiring an energy spectrum transmitted through the sample, located in an X and/or gamma spectral band; for each spectrum of a plurality of calibration spectra, calculating a likelihood from said calibration spectrum, and from the spectrum transmitted through the sample, each calibration spectrum corresponding to the energy spectrum transmitted through a stack of gauge blocks, each formed of a known thickness of a calibration material; and estimating the characteristic thicknesses associated with the sample according to the criterion of maximum likelihood.


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