The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2023

Filed:

Apr. 27, 2022
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Jean-Christophe Auchere, Gif-sur-Yvette, FR;

Hiroshi Hori, Châtillon, FR;

Adam Pedrycz, Edmonton, CA;

Bharat Narasimhan, Katy, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 47/12 (2012.01); E21B 44/02 (2006.01); E21B 49/00 (2006.01);
U.S. Cl.
CPC ...
E21B 47/12 (2013.01); E21B 44/02 (2013.01); E21B 49/00 (2013.01);
Abstract

Methods, apparatus, systems, and articles of manufacture are disclosed to measure a formation feature. An example apparatus includes a pre-processor to compare a first measurement obtained from a first sensor included in a logging tool at a first depth at a first time and a second measurement obtained from a second sensor included in the logging tool at the first depth at a second time. The example apparatus also include a semblance calculator to: calculate a correction factor based on a difference between the first measurement and the second measurement; and calculate a third measurement based on the correction factor and a fourth measurement obtained from the first sensor at a second depth at the second time. The example apparatus also includes a report generator to generate a report including the third measurement.


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