The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2023
Filed:
Oct. 27, 2020
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventor:
Masayuki Murata, Tokyo, JP;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); H04W 16/18 (2009.01); G06N 7/01 (2023.01); H04W 4/02 (2018.01); H04W 4/029 (2018.01);
U.S. Cl.
CPC ...
H04W 4/025 (2013.01); G06F 17/18 (2013.01); G06N 7/01 (2023.01); H04W 4/029 (2018.02); H04W 16/18 (2013.01);
Abstract
A placement of a set of devices in an environment is evaluated. At least a plurality of neighboring locations is selected for a target location in the environment. A probability of an estimated location conditioned on the target location is calculated for each of at least the plurality of neighboring locations as the estimated location by using an observation model for obtaining a set of observation values given a location under the placement. An evaluation metric is computed by using the probability calculated for each of at least the plurality of neighboring locations.