The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2023
Filed:
Jul. 23, 2019
Applicant:
Sony Corporation, Tokyo, JP;
Inventor:
Koyuru Okimoto, Tokyo, JP;
Assignee:
SONY CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04R 29/00 (2006.01); H04R 1/40 (2006.01);
U.S. Cl.
CPC ...
H04R 29/001 (2013.01); H04R 1/403 (2013.01); H04R 29/004 (2013.01);
Abstract
A measurement device according to an embodiment includes: a base portion (), a plurality of pillars () in an arc shape not directly facing one another having one end of each connected to the base portion and the other end of each coupled by a coupling portion (), and a plurality of speakers () provided on each of the pillars and having distances to a certain location substantially uniform.
Okimoto, Koyuru. (2023). Measurement device and measurement system (U.S. Patent No. 11805377). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11805377
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile