The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Oct. 05, 2021
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Kyung Ho Lee, Gyeonggi-do, KR;

Jae Hun Jang, Gyeonggi-do, KR;

Kyoung Mook Lim, Gyeonggi-do, KR;

Cheol Jon Jang, Gyeonggi-do, KR;

Keun Soo Cho, Gyeonggi-do, KR;

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/80 (2023.01); G06T 7/33 (2017.01); G06T 5/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
H04N 23/80 (2023.01); G06T 5/001 (2013.01); G06T 7/0002 (2013.01); G06T 7/337 (2017.01); G06T 2207/20172 (2013.01);
Abstract

Disclosed is an image sensing device including a plurality of defect detectors each suitable for detecting whether a corresponding target image value is defective, and generating detection information corresponding to a result of the detection, a defect scheduler suitable for sequentially outputting one or more defective image values, which are the target image values detected as defective among the plurality of target image values, based on the detection information, and a defect corrector suitable for correcting the output defective image values.


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