The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Nov. 21, 2018
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Hidenori Takahashi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); H01J 49/16 (2006.01); H01J 49/40 (2006.01); H01J 49/00 (2006.01); H01J 49/24 (2006.01); G01N 27/623 (2021.01);
U.S. Cl.
CPC ...
H01J 49/0031 (2013.01); G01N 27/623 (2021.01); H01J 49/0045 (2013.01); H01J 49/0495 (2013.01); H01J 49/164 (2013.01); H01J 49/24 (2013.01); H01J 49/40 (2013.01);
Abstract

A mass spectrometer, which is for generating a product ion from a precursor ion derived from a sample component having a hydrocarbon chain to analyze a mass, includes a reaction chamberinto which the precursor ion is introduced, radical generating units, andthat generate a radical having an oxidizing ability or/and a radical other than a hydrogen radical having a reducing ability, a radical irradiation unitthat irradiates the inside of the reaction chamberwith the generated radical, a separation detection unitthat separates and detects the product ion generated from the precursor ion by a reaction with the radical according to a mass-to-charge ratio, and a structure estimation unitthat estimates the structure of the sample component based on the mass-to-charge ratio of the detected product ions and the information on the structure or the structure candidate.


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