The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2023
Filed:
Jul. 27, 2020
Applicant:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA (US);
Inventors:
Ruth Bloom, Pleasanton, CA (US);
Sang Tae Park, Pleasanton, CA (US);
Bryan Reed, Pleasanton, CA (US);
Daniel Masiel, Pleasanton, CA (US);
Assignee:
INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC., Pleasanton, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); H01J 37/147 (2006.01); H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
H01J 37/26 (2013.01); H01J 37/1474 (2013.01); H01J 37/244 (2013.01); H01J 2237/2802 (2013.01); H01J 2237/2804 (2013.01);
Abstract
Methods and systems for acquiring transmission electron microscope video data on a rolling-shutter detector at an enhanced frame rate and without temporal distortions are described. Also described are methods to enhance the dynamic range of image and diffraction data acquired using a transmission electron microscope. The disclosed methods and systems may also be applicable to photon detection and imaging systems.