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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11804040 B1

PDFFull Text
Date of Patent:
Oct. 31, 2023

Filed:

Dec. 02, 2021

Keypoint-based sampling for pose estimation

Applicant:

Qualcomm Technologies, Inc., San Diego, CA (US);

Inventors:

Shreyas Hampali, Graz, AT;

Vincent Lepetit, Talence, FR;

Clemens Arth, Gratwein-Strassengel, AT;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:

Polsinelli/Qualcomm

Primary Examiner:

Todd Buttram

Int. Cl.
CPC ...
G06V 20/20 (2022.01); G06T 7/73 (2017.01); G06V 40/10 (2022.01); G06T 9/00 (2006.01); G06T 7/80 (2017.01); G06T 7/50 (2017.01); G06T 19/00 (2011.01); G06V 10/40 (2022.01); G06V 10/82 (2022.01); G06K 9/62 (2022.01); G06N 3/04 (2023.01); G06F 18/213 (2023.01); G06F 18/2431 (2023.01);
U.S. Cl.
CPC ...
G06V 20/20 (2022.01); G06F 18/213 (2023.01); G06F 18/2431 (2023.01); G06N 3/04 (2013.01); G06T 7/50 (2017.01); G06T 7/73 (2017.01); G06T 7/80 (2017.01); G06T 9/002 (2013.01); G06T 19/006 (2013.01); G06V 10/40 (2022.01); G06V 10/82 (2022.01); G06V 40/11 (2022.01); G06T 2200/08 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30196 (2013.01); G06T 2207/30244 (2013.01);
Abstract

Systems and techniques are provided for determining one or more poses of one or more objects. For example, a process can include determining, using a machine learning system, a plurality of keypoints from an image. The plurality of keypoints are associated with at least one object in the image. The process can include determining a plurality of features from the machine learning system based on the plurality of keypoints. The process can include classifying the plurality of features into a plurality of joint types. The process can include determining pose parameters for the at least one object based on the plurality of joint types.

Find Patent Forward Citations

Hampali, Shreyas. (2023). Keypoint-based sampling for pose estimation (U.S. Patent No. 11804040). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11804040

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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