The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Dec. 29, 2020
Applicant:

Ecoatm, Llc, San Diego, CA (US);

Inventors:

Babak Forutanpour, San Diego, CA (US);

Jeffrey Ploetner, San Diego, CA (US);

Assignee:

ecoATM, LLC, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 18/22 (2023.01); G06F 18/24 (2023.01); G06T 7/40 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06F 18/22 (2023.01); G06F 18/24 (2023.01); G06T 7/001 (2013.01); G06T 7/40 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30121 (2013.01);
Abstract

Systems and methods for detecting the cracks in illuminated electronic device screens are disclosed. In one embodiment, the method includes receiving an image of an electronic device screen and retrieving a plurality of kernels, each having values corresponding to a line region and a non-line region, with the orientation of the line region and the non-line region differing for each kernel. At least some of the kernels are applied to the image to obtain, at various locations of the image, values corresponding to the line regions and the non-line regions. Based on the values corresponding to the line regions and the non-line regions, cracks are automatically identified in the electronic device screen.


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