The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2023
Filed:
Mar. 28, 2018
Applicant:
Dpix, Llc, Colorado Springs, CO (US);
Inventors:
Jerome David Crocco, Colorado Springs, CO (US);
Paul R. O'Hern, Jr., Colorado Springs, CO (US);
Assignee:
dpiX, LLC, Colorado Springs, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 11/07 (2006.01); G06N 5/046 (2023.01); G06N 20/00 (2019.01); G06N 3/08 (2023.01); G06V 10/98 (2022.01); G06V 10/82 (2022.01); G06F 18/24 (2023.01); G06N 3/045 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06F 11/079 (2013.01); G06F 18/24 (2023.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01); G06N 5/046 (2013.01); G06N 20/00 (2019.01); G06V 10/82 (2022.01); G06V 10/993 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30108 (2013.01);
Abstract
A quality improvement method for an image sensor array includes collecting in-line optical inspection data of the image sensor, collecting end of line electrical data of the image sensor, creating defect maps and obtaining x-y coordinates of the optical inspection data and the electrical data, correlating the defect maps to generate correlated defects, classifying the images of the correlated defects, and generating root cause statistics of the classified correlated defects.