The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Apr. 22, 2021
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventor:

Suhas Shivanna, Karnataka, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 2221/034 (2013.01);
Abstract

Aspects of vulnerability scanning are disclosed. In one example, configuration and context information of a first device for which vulnerability scanning is to be performed is obtained. The configuration information includes telemetry data of the first device. A second device is provisioned based on the configuration information to create a cloned first device. The vulnerability scanning is performed on the cloned first device based on the context information to obtain a scan report.


Find Patent Forward Citations

Shivanna, Suhas. (2023). Vulnerability scanning (U.S. Patent No. 11803646). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11803646

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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