The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2023
Filed:
May. 20, 2022
Sap SE, Walldorf, DE;
Noah Slavitch, Waterloo, CA;
Reza Sherkat, Waterloo, CA;
SAP SE, Walldorf, DE;
Abstract
Techniques and solutions are described that can be used to determine data subsets of a data set that may be responsive to a query. In one aspect, imprints are created for the data subsets, where an imprint indicates whether, for a plurality of bins, a data subset contains values within respective bins. The bins are defined at least in part using data for a set of queries. In another aspect, at least one bin of a plurality of bins is designated to be associated with values of the data set satisfying a threshold frequency. In a further aspect, imprints are created for a plurality of bins, where an imprint indicates whether the plurality of data subsets comprise a value for a given bin. A query imprint can be compared with the data subset imprints or bin imprints to determine data subsets that may be responsive to an associated query.