The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Sep. 01, 2021
Applicant:

National Instruments Corporation, Austin, TX (US);

Inventors:

Sundeep Chandhoke, Austin, TX (US);

Gururaja Kasanadi Ramachandra, Bangalore, IN;

Rajaramm Chokkalingam Malarvizhy, Tamil Nadu, IN;

Varun Mehra, Bengaluru, IN;

Bjoern Bachmann, Lichtenberg, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/273 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2733 (2013.01); G06F 11/2242 (2013.01);
Abstract

Methods and computing devices for allocating test pods to a distributed computing system for executing a test plan on a device-under-test (DUT). Each test pod may include a test microservice including one or more test steps and an event microservice specifying function relations between the test microservice and other test microservices. The test pods are allocated to different servers to perform a distributed execution of the test plan on the DUT through one or more test interfaces.


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