The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Oct. 15, 2021
Applicant:

Ethernovia Inc., San Jose, CA (US);

Inventors:

Darren S. Engelkemier, Menlo Park, CA (US);

Roy T. Myers, Jr., Morgan City, CA (US);

Hossein Sedarat, San Jose, CA (US);

Ramin Shirani, Morgan Hill, CA (US);

Assignee:

Ethernovia Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0294 (2013.01); G05B 23/021 (2013.01); G05B 23/0237 (2013.01); G05B 23/0297 (2013.01);
Abstract

Disclosed are systems, methods, and non-transitory computer-readable media for determining diagnostic coverage for achieving functional safety. A diagnostic coverage determination system employs an optimized process for efficiently determining a diagnostic coverage level of an electronic circuit. The diagnostic coverage determination system generates an optimized netlist that includes a reduced number of nodes by applying one or more node reduction techniques. The diagnostic coverage is determined based on the optimized netlist, thereby reducing the number of nodes that are injected with faults.


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