The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2023
Filed:
Dec. 15, 2020
University of Washington, Seattle, WA (US);
Jonathan T. C. Liu, Seattle, WA (US);
Lingpeng Wei, Seattle, WA (US);
Chengbo Yin, Seattle, WA (US);
University of Washington, Seattle, WA (US);
Abstract
Apparatuses, systems, and methods for dynamically shaped focal surface with a scanning microscope. A microscope (e.g., a scanning confocal microscope) may use a scanning element to scan an illumination beam to generate a focal region. The scanning element may include multiple degrees of freedom, such as rotation and translation along orthogonal axes. For example, if the illumination beam is a line focus, rotation along a first axis and translation along a second orthogonal axis may sweep the line focus across a focal surface which is substantially flat and normal to the second axis. In some embodiments, the microscope may be a dual-axis handheld microscope, where a single objective in a handheld housing is used to both direct the scanned illumination beam and receive the collected light.