The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Jul. 03, 2020
Applicant:

Ateco Inc., Gunpo, KR;

Inventor:

Taek Seon Lee, Hwaseong, KR;

Assignee:

ATECO INC., Gunpo, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2863 (2013.01); G01R 31/2867 (2013.01); G01R 31/2868 (2013.01);
Abstract

A memory module system level tester device provides contact between the motherboard and the memory modules by using a test tray, thereby minimizing a time required for attaching and detaching the memory modules and omitting an additional configuration for attaching and detaching the memory modules. Accordingly, space limitations can be minimized, and as a result, test units can be arranged in two or more stages in the vertical direction to configure a compact layout to thereby increase space efficiency.


Find Patent Forward Citations

Lee, Taek. (2023). System level test device for memory (U.S. Patent No. 11802905). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11802905

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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