The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Jun. 01, 2018
Applicants:

Universite DE Lille, Lille, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

Inventors:

Alexis Vlandas, Villeneuve d'Ascq, FR;

Julien Wengler, Paris, FR;

Sebastien Lamant, Lille, FR;

Vincent Senez, Baisieux, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01); G01N 21/47 (2006.01); G01N 21/45 (2006.01); C12Q 1/34 (2006.01); G01N 21/55 (2014.01); G01N 21/77 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4133 (2013.01); C12Q 1/34 (2013.01); G01N 21/55 (2013.01); G01N 21/77 (2013.01);
Abstract

A process for detecting the sensitivity of one or more polymers and/or of one or more, mixtures of polymers to a compound, including the steps of exposing at least one lens-shaped micro-deposit, including the polymer(s) and/or the mixture(s) of polymers, to the compound, and detecting, by illuminating the surface of this micro-deposit, a change in the spatial distribution of the intensity of the light reflected or transmitted by this micro-deposit, linked to a variation in the dimensions and/or refractive index of this micro-deposit, under the effect of an interaction between the polymer(s) and/or the mixture(s) of polymers and the compound.


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