The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Jul. 30, 2018
Applicant:

Chiba Institute of Technology, Chiba, JP;

Inventor:

Masahiro Tomono, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01); G01C 21/36 (2006.01); G06T 17/05 (2011.01); G01S 17/89 (2020.01); G06V 20/58 (2022.01);
U.S. Cl.
CPC ...
G01C 21/3804 (2020.08); G01C 21/367 (2013.01); G01C 21/387 (2020.08); G01C 21/3885 (2020.08); G01S 17/89 (2013.01); G06T 17/05 (2013.01); G06V 20/58 (2022.01); G06T 2207/10028 (2013.01);
Abstract

Provided are a map generation system and a mobile object configured so that the map accuracy of an occupancy grid map can be ensured while a memory capacity and an arithmetic processing load can be reduced. The map generation system includes a storage () configured to store, as detection information, a detection value obtained for each detection unit by a detection device () in chronological order, a map producer () configured to produce the occupancy grid map based on the detection information stored in the storage () and cause the storage () to store the occupancy grid map, and an influence ratio calculator () configured to calculate an influence ratio for the occupancy grid map for each piece of detection information stored in the storage (). The map producer () sorts the detection information based on the influence ratio calculated by the influence ratio calculator () to produce the occupancy grid map.


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