The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Nov. 29, 2019
Applicants:

Korea Institute of Civil Engineering and Building Technology, Goyang-si, KR;

Uninetec.corp, Seoul, KR;

Inventors:

Ki Seok Kwak, Seoul, KR;

Jae Hyun Park, Goyang-si, KR;

Moon Kyung Chung, Seoul, KR;

Seung Hwan Seo, Daegu, KR;

Young Hun Ko, Seoul, KR;

Bongkun Kwak, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 9/10 (2006.01); G01C 9/02 (2006.01); G01C 25/00 (2006.01);
U.S. Cl.
CPC ...
G01C 9/10 (2013.01); G01C 9/02 (2013.01); G01C 25/005 (2013.01); G01C 2009/107 (2013.01);
Abstract

Provided is an apparatus for measuring a slope change amount of a structure, the apparatus being characterized by including: a bottom body () formed in a spherical surface having a predetermined radius of curvature; a ball () installed on an upper surface of the bottom body () and moving due to a gravitational force; and a camera () for imaging the bottom body () on which the ball () is located. In accordance with the present invention, there is an effect in that a slope change amount of a structure for a certain period may accurately be measured.


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